Report date: Nov 6,2024
Conflict count: 361874
Publisher: IOS Press
Title count: 12
Conflict count: 578


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Created: 2019-11-30 16:33:34
ConfID: 5559364
CauseID: 1459179271
JT: Journal of X-Ray Science and Technology
MD: Erofeev,7,1,71,1997,Method of Eigenvectors for Numerical Studies of Multilayer Gratings
DOI: 10.3233/XST-1997-7106(Journal) (5559364-N)
==========================================================

Created: 2019-11-30 16:33:43
ConfID: 5559365
CauseID: 1459179278
JT: Journal of X-Ray Science and Technology
MD: Knight,7,2,87,1997,Soft X Rays in the 21st Century II
DOI: 10.3233/XST-1997-7201(Journal) (5559365-N)
==========================================================

Created: 2019-11-30 16:33:49
ConfID: 5559366
CauseID: 1459179286
JT: Journal of X-Ray Science and Technology
MD: Baez,7,2,90,1997,Anecdotes about the Early Days of X-Ray Optics
DOI: 10.3233/XST-1997-7202(Journal) (5559366-N)
==========================================================

Created: 2019-11-30 16:33:58
ConfID: 5559367
CauseID: 1459179291
JT: Journal of X-Ray Science and Technology
MD: Michette,7,2,98,1997,Projected Advances in Laboratory Soft X-Ray Systems and Their Applications
DOI: 10.3233/XST-1997-7203(Journal) (5559367-N)
==========================================================

Created: 2019-11-30 16:32:54
ConfID: 5559360
CauseID: 1459179235
JT: Journal of X-Ray Science and Technology
MD: Pelletier,6,4,359,1996,Calibrated Time-Resolved Transmission Grating Spectrometer for the Study of Ultrafast X-Ray Sources
DOI: 10.3233/XST-1996-6404(Journal) (5559360-N)
==========================================================

Created: 2019-11-30 16:33:01
ConfID: 5559361
CauseID: 1459179241
JT: Journal of X-Ray Science and Technology
MD: Yan,7,1,1,1997,X-Ray Focusing Optics and Its Applications in XRMF and XRL
DOI: 10.3233/XST-1997-7101(Journal) (5559361-N)
==========================================================

Created: 2019-11-30 16:33:09
ConfID: 5559362
CauseID: 1459179245
JT: Journal of X-Ray Science and Technology
MD: Fezzaa,7,1,12,1997,X-Ray Interferometry at ESRF Using Two Coherent Beams from Fresnel Mirrors
DOI: 10.3233/XST-1997-7102(Journal) (5559362-N)
==========================================================

Created: 2019-11-30 16:33:14
ConfID: 5559363
CauseID: 1459179256
JT: Journal of X-Ray Science and Technology
MD: Guichet,7,1,24,1997,Influence of the Number of Bilayers on the Optical Performances of X-UV Multilayer Interferential Mirrors
DOI: 10.3233/XST-1997-7103(Journal) (5559363-N)
==========================================================

Created: 2019-11-30 16:34:28
ConfID: 5559372
CauseID: 1459179315
JT: Journal of X-Ray Science and Technology
MD: Thompson,7,2,159,1997,Reactive Gas Magnetron Sputtering of Lithium Hydride and Lithium Fluoride Thin Films
DOI: 10.3233/XST-1997-7207(Journal) (5559372-N)
==========================================================

Created: 2019-11-30 16:34:33
ConfID: 5559373
CauseID: 1459179320
JT: Journal of X-Ray Science and Technology
MD: Fraenkel,7,2,171,1997,Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas
DOI: 10.3233/XST-1997-7208(Journal) (5559373-N)
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Created: 2019-11-30 16:34:39
ConfID: 5559374
CauseID: 1459179325
JT: Journal of X-Ray Science and Technology
MD: Gizzi,7,2,186,1997,Time-Resolved, Multi-frame X-Ray Imaging of Laser-Produced Plasmas
DOI: 10.3233/XST-1997-7209(Journal) (5559374-N)
==========================================================

Created: 2019-11-30 16:34:49
ConfID: 5559375
CauseID: 1459179332
JT: Journal of X-Ray Science and Technology
MD: Giakos,7,2,198,1997,Electric Field Dependence on Charge Collection of CdZnTe X-Ray Detectors
DOI: 10.3233/XST-1997-7210(Journal) (5559375-N)
==========================================================

Created: 2019-11-30 16:34:04
ConfID: 5559369
CauseID: 1459179297
JT: Journal of X-Ray Science and Technology
MD: Fiorini,7,2,117,1997,Silicon Drift Detectors with On-Chip Electronics for X-Ray Spectroscopy
DOI: 10.3233/XST-1997-7204(Journal) (5559369-N)
==========================================================

Created: 2019-11-30 16:34:18
ConfID: 5559370
CauseID: 1459179305
JT: Journal of X-Ray Science and Technology
MD: Kantsyrev,7,2,139,1997,New Concepts for X-Ray, Soft X-Ray, and EUV Optical Instrumentation Including Applications in Spectroscopy, Plasma Diagnostics, and Biomedical Microscopy: A Status Report
DOI: 10.3233/XST-1997-7206(Journal) (5559370-N)
==========================================================

Created: 2019-11-30 16:34:14
ConfID: 5559371
CauseID: 1459179304
JT: Journal of X-Ray Science and Technology
MD: Viitanen,7,2,130,1997,Fabrication of Radiation Entrance Windows with Optimized sub-100 eV Transmission Properties
DOI: 10.3233/XST-1997-7205(Journal) (5559371-N)
==========================================================

Created: 2019-11-30 16:26:05
ConfID: 5559316
CauseID: 1459178894
JT: Journal of X-Ray Science and Technology
MD: Carroll,4,4,323,1994,Use of Monochromatic X Rays in Medical Diagnosis and Therapy What Is It Going to Take?
DOI: 10.3233/XST-1994-4407(Journal) (5559316-N)
==========================================================

Created: 2019-11-30 16:26:10
ConfID: 5559317
CauseID: 1459178899
JT: Journal of X-Ray Science and Technology
MD: Boone,4,4,334,1994,A Figure of Merit Comparison between Bremsstrahlung and Monoenergetic X-Ray Sources for Angiography
DOI: 10.3233/XST-1994-4408(Journal) (5559317-N)
==========================================================

Created: 2019-11-30 16:26:19
ConfID: 5559318
CauseID: 1459178906
JT: Journal of X-Ray Science and Technology
MD: Dong,4,4,346,1994,Current Status of the VU MFEL Compton X-Ray Program
DOI: 10.3233/XST-1994-4409(Journal) (5559318-N)
==========================================================

Created: 2019-11-30 16:26:28
ConfID: 5559319
CauseID: 1459178912
JT: Journal of X-Ray Science and Technology
MD: Nelson,4,4,353,1994,Large Area Image Plane Sensors for Radiography
DOI: 10.3233/XST-1994-4410(Journal) (5559319-N)
==========================================================

Created: 2019-11-30 16:25:30
ConfID: 5559312
CauseID: 1459178864
JT: Journal of X-Ray Science and Technology
MD: Umstadter,4,4,263,1994,Ultrashort Ultraviolet Free-Electron Lasers
DOI: 10.3233/XST-1994-4402(Journal) (5559312-N)
==========================================================

Created: 2019-11-30 16:25:43
ConfID: 5559313
CauseID: 1459178875
JT: Journal of X-Ray Science and Technology
MD: Hmelo,4,4,290,1994,Nondestructive Evaluation of Millimeter Scale Engineered Structures Using Synchrotron X-Ray Microtomography
DOI: 10.3233/XST-1993-4404(Journal) (5559313-N)
==========================================================

Created: 2019-11-30 16:25:49
ConfID: 5559314
CauseID: 1459178883
JT: Journal of X-Ray Science and Technology
MD: Tompkins,4,4,301,1994,Application of Graphite Mosaic Monochromator Crystals for X-Ray Transport
DOI: 10.3233/XST-1994-4405(Journal) (5559314-N)
==========================================================

Created: 2019-11-30 16:25:58
ConfID: 5559315
CauseID: 1459178889
JT: Journal of X-Ray Science and Technology
MD: Kieffer,4,4,312,1994,X-Ray Sources Based on Subpicosecond-Laser-Produced Plasmas
DOI: 10.3233/XST-1994-4406(Journal) (5559315-N)
==========================================================

Created: 2019-11-30 16:26:59
ConfID: 5559324
CauseID: 1459178941
JT: Journal of X-Ray Science and Technology
MD: Stead,5,1,52,1995,The Use of Soft X Rays to Study the Ultrastructure of Living Biological Material
DOI: 10.3233/XST-1995-5105(Journal) (5559324-N)
==========================================================

Created: 2019-11-30 16:27:08
ConfID: 5559325
CauseID: 1459178945
JT: Journal of X-Ray Science and Technology
MD: Chernov,5,1,65,1995,Study of the Inner Structure of Co/C and Ni/C Multilayers Prepared by Pulsed Laser Evaporation Method
DOI: 10.3233/XST-1995-5106(Journal) (5559325-N)
==========================================================

Created: 2019-11-30 16:27:13
ConfID: 5559326
CauseID: 1459178951
JT: Journal of X-Ray Science and Technology
MD: Yaakobi,5,1,73,1995,Monochromatic Backlighting as a Laser-Fusion Diagnostic
DOI: 10.3233/XST-1995-5107(Journal) (5559326-N)
==========================================================

Created: 2019-11-30 16:27:24
ConfID: 5559327
CauseID: 1459178958
JT: Journal of X-Ray Science and Technology
MD: Ridgeley,5,1,88,1995,An Elliptical Crystal Spectrometer Suitable for EXAFS Studies of Laser Compressed Materials and for High Resolution X-Ray Spectroscopy
DOI: 10.3233/XST-1995-5108(Journal) (5559327-N)
==========================================================

Created: 2019-11-30 16:26:33
ConfID: 5559320
CauseID: 1459178918
JT: Journal of X-Ray Science and Technology
MD: Shealy,5,1,1,1995,Optical Analysis of an Ultra-High Resolution Two-Mirror Soft X-Ray Microscope
DOI: 10.3233/XST-1995-5101(Journal) (5559320-N)
==========================================================

Created: 2019-11-30 16:26:40
ConfID: 5559321
CauseID: 1459178923
JT: Journal of X-Ray Science and Technology
MD: Durfee,5,1,20,1995,Goldhelox: A Soft X-Ray Solar Telescope
DOI: 10.3233/XST-1995-5102(Journal) (5559321-N)
==========================================================

Created: 2019-11-30 16:26:48
ConfID: 5559322
CauseID: 1459178927
JT: Journal of X-Ray Science and Technology
MD: Gluskin,5,1,29,1995,Soft X-Ray Instrumentation and Its Applications at the Advanced Photon Source
DOI: 10.3233/XST-1995-5103(Journal) (5559322-N)
==========================================================

Created: 2019-11-30 16:26:54
ConfID: 5559323
CauseID: 1459178936
JT: Journal of X-Ray Science and Technology
MD: Peterson,5,1,43,1995,A Capillary Discharge as a Potential X-Ray Laser Driver
DOI: 10.3233/XST-1995-5104(Journal) (5559323-N)
==========================================================

Created: 2019-11-30 16:23:33
ConfID: 5559300
CauseID: 1459178771
JT: Journal of X-Ray Science and Technology
MD: Zwicker,4,1,57,1993,Analysis of Impurity Content and Transport in Tokamak Plasmas Using Low-Resolution XUV Spectra
DOI: 10.3233/XST-1993-4106(Journal) (5559300-N)
==========================================================

Created: 2019-11-30 16:23:54
ConfID: 5559301
CauseID: 1459178787
JT: Journal of X-Ray Science and Technology
MD: Mutikainen,4,2,82,1994,Large-Area Pressure-Enduring Entrance Windows for Soft X-Ray Regime
DOI: 10.3233/XST-1994-4202(Journal) (5559301-N)
==========================================================

Created: 2019-11-30 16:23:59
ConfID: 5559302
CauseID: 1459178795
JT: Journal of X-Ray Science and Technology
MD: Tarrio,4,2,96,1994,The New NIST/ARPA National Soft X-Ray Reflectometry Facility
DOI: 10.3233/XST-1994-4203(Journal) (5559302-N)
==========================================================

Created: 2019-11-30 16:24:08
ConfID: 5559303
CauseID: 1459178800
JT: Journal of X-Ray Science and Technology
MD: Elliott,4,2,102,1994,Application of Scanning Microradiography and X-Ray Microtomography to Studies of Bones and Teeth
DOI: 10.3233/XST-1994-4204(Journal) (5559303-N)
==========================================================

Created: 2019-11-30 16:22:54
ConfID: 5559296
CauseID: 1459178741
JT: Journal of X-Ray Science and Technology
MD: Burge,3,4,311,1992,X-Ray Microscopy at Suboptical Resolution: Direct Observation of the 65-nm Periodicity in Collagen Fibrils
DOI: 10.3233/XST-1992-3404(Journal) (5559296-N)
==========================================================

Created: 2019-11-30 16:23:03
ConfID: 5559297
CauseID: 1459178746
JT: Journal of X-Ray Science and Technology
MD: Filatova,4,1,1,1993,The Anisotropy of X-Ray Reflection and Scattering from Hexagonal BN
DOI: 10.3233/XST-1993-4101(Journal) (5559297-N)
==========================================================

Created: 2019-11-30 16:23:14
ConfID: 5559298
CauseID: 1459178753
JT: Journal of X-Ray Science and Technology
MD: Lawson,4,1,18,1993,Flux Maximization Techniques for Compton Backscatter Depth Profilometry
DOI: 10.3233/XST-1993-4103(Journal) (5559298-N)
==========================================================

Created: 2019-11-30 16:23:28
ConfID: 5559299
CauseID: 1459178767
JT: Journal of X-Ray Science and Technology
MD: Tomov,4,1,44,1993,Picosecond X-Ray Pulses Generated in a Diode Driven by 193-nm Picosecond Laser Pulses
DOI: 10.3233/XST-1993-4105(Journal) (5559299-N)
==========================================================

Created: 2019-11-30 16:24:58
ConfID: 5559308
CauseID: 1459178838
JT: Journal of X-Ray Science and Technology
MD: Davis,4,3,191,1994,The Effect of Linear Interpolation of the Filtered Projections on Image Noise in X-Ray Computed Tomography
DOI: 10.3233/XST-1993-4303(Journal) (5559308-N)
==========================================================

Created: 2019-11-30 16:25:03
ConfID: 5559309
CauseID: 1459178841
JT: Journal of X-Ray Science and Technology
MD: Bridou,4,3,200,1994,Grazing X-Ray Reflectometry Data Processing by Fourier Transform
DOI: 10.3233/XST-1993-4304(Journal) (5559309-N)
==========================================================

Created: 2019-11-30 16:25:09
ConfID: 5559310
CauseID: 1459178848
JT: Journal of X-Ray Science and Technology
MD: Geppert,4,3,217,1994,Application of Structural Phase Transitions in X-Ray Spectroscopy
DOI: 10.3233/XST-1993-4305(Journal) (5559310-N)
==========================================================

Created: 2019-11-30 16:25:23
ConfID: 5559311
CauseID: 1459178858
JT: Journal of X-Ray Science and Technology
MD: Luccio,4,4,247,1994,Coherent Compton X-Ray Sources
DOI: 10.3233/XST-1994-4401(Journal) (5559311-N)
==========================================================

Created: 2019-11-30 16:24:14
ConfID: 5559304
CauseID: 1459178804
JT: Journal of X-Ray Science and Technology
MD: Spiller,4,2,118,1994,Diffraction-Limited Large X-Ray Optics
DOI: 10.3233/XST-1994-4205(Journal) (5559304-N)
==========================================================

Created: 2019-11-30 16:24:34
ConfID: 5559305
CauseID: 1459178821
JT: Journal of X-Ray Science and Technology
MD: Sareen,4,2,151,1994,Developments in X-Ray Detectors and Associated Electronics: A Review of the Technology and Possible Future Trends
DOI: 10.3233/XST-1994-4208(Journal) (5559305-N)
==========================================================

Created: 2019-11-30 16:24:43
ConfID: 5559306
CauseID: 1459178826
JT: Journal of X-Ray Science and Technology
MD: Hawryluk,4,3,167,1994,Power Loading Limitations in Soft X-Ray Projection Lithography
DOI: 10.3233/XST-1993-4301(Journal) (5559306-N)
==========================================================

Created: 2019-11-30 16:24:50
ConfID: 5559307
CauseID: 1459178833
JT: Journal of X-Ray Science and Technology
MD: Viitanen,4,3,182,1994,Comparison of Ultrathin X-Ray Window Designs
DOI: 10.3233/XST-1993-4302(Journal) (5559307-N)
==========================================================

Created: 2019-11-30 16:31:18
ConfID: 5559348
CauseID: 1459179154
JT: Journal of X-Ray Science and Technology
MD: Yu,6,2,167,1996,Non-destructive and Quantitative Investigation of Jingdezhen Blue and White Porcelains Using EDXRF
DOI: 10.3233/XST-1996-6204(Journal) (5559348-N)
==========================================================

Created: 2019-11-30 16:31:25
ConfID: 5559349
CauseID: 1459179162
JT: Journal of X-Ray Science and Technology
MD: Yaakobi,6,2,172,1996,Diagnosis of High-Temperature Implosions Using Low- and High-Opacity Krypton Lines
DOI: 10.3233/XST-1996-6205(Journal) (5559349-N)
==========================================================

Created: 2019-11-30 16:31:33
ConfID: 5559350
CauseID: 1459179169
JT: Journal of X-Ray Science and Technology
MD: Giakos,6,2,188,1996,Enhanced X-Ray Detectors Using Polar Dopants for KCD Digital Radiography
DOI: 10.3233/XST-1996-6206(Journal) (5559350-N)
==========================================================

Created: 2019-11-30 16:31:39
ConfID: 5559351
CauseID: 1459179174
JT: Journal of X-Ray Science and Technology
MD: Kaftandjian,6,2,205,1996,A Comparison of the Ball, Wire, Edge, and Bar/Space Pattern Techniques for Modulation Transfer Function Measurements of Linear X-Ray Detectors
DOI: 10.3233/XST-1996-6207(Journal) (5559351-N)
==========================================================

Created: 2019-11-30 16:30:54
ConfID: 5559344
CauseID: 1459179135
JT: Journal of X-Ray Science and Technology
MD: Kaftandjian,6,1,94,1996,High-Resolution X-Ray Computed Tomography Using a Solid-State Linear Detector
DOI: 10.3233/XST-1996-6107(Journal) (5559344-N)
==========================================================

Created: 2019-11-30 16:31:04
ConfID: 5559345
CauseID: 1459179143
JT: Journal of X-Ray Science and Technology
MD: Lebert,6,2,107,1996,Pinch Plasma Source for X-Ray Microscopy with Nanosecond Exposure Time
DOI: 10.3233/XST-1996-6201(Journal) (5559345-N)
==========================================================

Created: 2019-11-30 16:31:06
ConfID: 5559346
CauseID: 1459179147
JT: Journal of X-Ray Science and Technology
MD: Kopilets,6,2,141,1996,Evolution of Structure, Phase Composition, and X-Ray Reflectivity of Multilayer Mirrors Mo–(B + C) after Annealing at 250–1100°C
DOI: 10.3233/XST-1996-6202(Journal) (5559346-N)
==========================================================

Created: 2019-11-30 16:31:13
ConfID: 5559347
CauseID: 1459179150
JT: Journal of X-Ray Science and Technology
MD: Balakireva,6,2,150,1996,Two-Period Multilayer Mirrors for the Soft X-Ray Region
DOI: 10.3233/XST-1996-6203(Journal) (5559347-N)
==========================================================

Created: 2019-11-30 16:32:19
ConfID: 5559356
CauseID: 1459179205
JT: Journal of X-Ray Science and Technology
MD: Lawson,6,3,299,1996,The Spin Dependent Momentum Density of Hexagonal Close Packed Cobalt
DOI: 10.3233/XST-1996-6306(Journal) (5559356-N)
==========================================================

Created: 2019-11-30 16:32:28
ConfID: 5559357
CauseID: 1459179209
JT: Journal of X-Ray Science and Technology
MD: Turley,6,3,308,1996,International Conference on Soft X-Rays in the 21st Century
DOI: 10.3233/XST-1996-6307(Journal) (5559357-N)
==========================================================

Created: 2019-11-30 16:32:39
ConfID: 5559358
CauseID: 1459179224
JT: Journal of X-Ray Science and Technology
MD: Davis,6,4,317,1996,X-Ray Diffraction Imaging Using Perfect Crystals
DOI: 10.3233/XST-1996-6402(Journal) (5559358-N)
==========================================================

Created: 2019-11-30 16:32:48
ConfID: 5559359
CauseID: 1459179229
JT: Journal of X-Ray Science and Technology
MD: Giakos,6,4,343,1996,Line Spread Function Study of Kinestatic Charge Detectors Operating at High Gas Pressures
DOI: 10.3233/XST-1996-6403(Journal) (5559359-N)
==========================================================

Created: 2019-11-30 16:31:45
ConfID: 5559352
CauseID: 1459179180
JT: Journal of X-Ray Science and Technology
MD: Artioukov,6,3,223,1996,Effects of a Near-Surface Transition Layer on X-Ray Reflection and Scattering
DOI: 10.3233/XST-1996-6301(Journal) (5559352-N)
==========================================================

Created: 2019-11-30 16:31:54
ConfID: 5559353
CauseID: 1459179185
JT: Journal of X-Ray Science and Technology
MD: Golubev,6,3,244,1996,Soft X-Ray Emission from Millimeter-Wave Electron Cyclotron Resonance Discharge
DOI: 10.3233/XST-1996-6302(Journal) (5559353-N)
==========================================================

Created: 2019-11-30 16:32:08
ConfID: 5559354
CauseID: 1459179196
JT: Journal of X-Ray Science and Technology
MD: Linlor,6,3,261,1996,Action Constant for Bremsstrahlung from Electron-and-Nucleus Collisions
DOI: 10.3233/XST-1996-6304(Journal) (5559354-N)
==========================================================

Created: 2019-11-30 16:32:13
ConfID: 5559355
CauseID: 1459179198
JT: Journal of X-Ray Science and Technology
MD: Owens,6,3,269,1996,The X-Ray CCDs Developed for the Joint European X-Ray Telescope
DOI: 10.3233/XST-1996-6305(Journal) (5559355-N)
==========================================================

Created: 2019-11-30 16:28:03
ConfID: 5559332
CauseID: 1459178992
JT: Journal of X-Ray Science and Technology
MD: Medenwaldt,5,2,202,1995,Production of Ultra Thin Silicon Foils
DOI: 10.3233/XST-1995-5203(Journal) (5559332-N)
==========================================================

Created: 2019-11-30 16:28:18
ConfID: 5559333
CauseID: 1459179004
JT: Journal of X-Ray Science and Technology
MD: Lehnert,5,2,221,1995,Ray Tracing for Crystal-Diffraction Spectrometers with Position-Sensitive Detectors
DOI: 10.3233/XST-1995-5205(Journal) (5559333-N)
==========================================================

Created: 2019-11-30 16:28:23
ConfID: 5559334
CauseID: 1459179007
JT: Journal of X-Ray Science and Technology
MD: Jordan,5,2,228,1995,Entrance Window Design Parameters for High-Pressure Gas X-Ray Imaging Detectors
DOI: 10.3233/XST-1995-5206(Journal) (5559334-N)
==========================================================

Created: 2019-11-30 16:29:34
ConfID: 5559335
CauseID: 1459179069
JT: Journal of X-Ray Science and Technology
MD: Fraenkel,5,4,341,1995,Multiple Reflections in Single Crystals as a Tool for X-Ray Spectroscopy
DOI: 10.3233/XST-1995-5401(Journal) (5559335-N)
==========================================================

Created: 2019-11-30 16:27:29
ConfID: 5559328
CauseID: 1459178966
JT: Journal of X-Ray Science and Technology
MD: Daido,5,1,105,1995,Subnanosecond In-Line Soft X-Ray Holography Using Germanium Laser in the 20 nm Wavelength Region
DOI: 10.3233/XST-1995-5109(Journal) (5559328-N)
==========================================================

Created: 2019-11-30 16:27:34
ConfID: 5559329
CauseID: 1459178970
JT: Journal of X-Ray Science and Technology
MD: Diehl,5,1,121,1995,Microstructural and Chemical Characterization of the Inconel/Ti(N) Thin Film and Multilayer System
DOI: 10.3233/XST-1995-5110(Journal) (5559329-N)
==========================================================

Created: 2019-11-30 16:27:48
ConfID: 5559330
CauseID: 1459178979
JT: Journal of X-Ray Science and Technology
MD: Bac,5,2,161,1995,Theoretical and Experimental Investigation of X-Ray Diffraction by a Lamellar Multilayer Amplitude Grating
DOI: 10.3233/XST-1995-5201(Journal) (5559330-N)
==========================================================

Created: 2019-11-30 16:27:54
ConfID: 5559331
CauseID: 1459178985
JT: Journal of X-Ray Science and Technology
MD: Giakos,5,2,181,1995,Engineering Aspects of a Kinestatic Charge Detector
DOI: 10.3233/XST-1995-5202(Journal) (5559331-N)
==========================================================

Created: 2019-11-30 16:30:15
ConfID: 5559340
CauseID: 1459179104
JT: Journal of X-Ray Science and Technology
MD: MacDonald,6,1,32,1996,Applications and Measurements of Polycapillary X-Ray Optics
DOI: 10.3233/XST-1996-6102(Journal) (5559340-N)
==========================================================

Created: 2019-11-30 16:30:33
ConfID: 5559341
CauseID: 1459179118
JT: Journal of X-Ray Science and Technology
MD: Davis,6,1,63,1996,An Analysis of Biological Hard Tissues Using the Tomographic Reconstruction Error Formula
DOI: 10.3233/XST-1996-6104(Journal) (5559341-N)
==========================================================

Created: 2019-11-30 16:30:38
ConfID: 5559342
CauseID: 1459179122
JT: Journal of X-Ray Science and Technology
MD: Cornille,6,1,77,1996,Dielectronic Spectra for Ne-like Ions from F-like Low-Lying States
DOI: 10.3233/XST-1996-6105(Journal) (5559342-N)
==========================================================

Created: 2019-11-30 16:30:44
ConfID: 5559343
CauseID: 1459179127
JT: Journal of X-Ray Science and Technology
MD: Lehnert,6,1,83,1996,Luminosity of Bragg Crystal Diffraction Spectrometers with Flat and Focusing Crystals
DOI: 10.3233/XST-1996-6106(Journal) (5559343-N)
==========================================================

Created: 2019-11-30 16:29:39
ConfID: 5559336
CauseID: 1459179073
JT: Journal of X-Ray Science and Technology
MD: Pahl,5,4,368,1995,A Crystal Camera for Ultra-Small-Angle X-Ray Scattering Using Synchrotron Radiation
DOI: 10.3233/XST-1995-5402(Journal) (5559336-N)
==========================================================

Created: 2019-11-30 16:29:48
ConfID: 5559337
CauseID: 1459179082
JT: Journal of X-Ray Science and Technology
MD: Ponomarev,5,4,379,1995,ReflEXAFS Spectroscopy of Thin Fe/Sc Multilayers
DOI: 10.3233/XST-1995-5403(Journal) (5559337-N)
==========================================================

Created: 2019-11-30 16:29:54
ConfID: 5559338
CauseID: 1459179087
JT: Journal of X-Ray Science and Technology
MD: Chernov,5,4,389,1995,Structural Changes Study of Co/C and Ni/C Multilayers upon Annealing
DOI: 10.3233/XST-1995-5404(Journal) (5559338-N)
==========================================================

Created: 2019-11-30 16:30:10
ConfID: 5559339
CauseID: 1459179098
JT: Journal of X-Ray Science and Technology
MD: Gonzalez-Hernandez,6,1,1,1996,The Structure of W/C (0.15 < γ < 0.8) Multilayers Annealed in Argon or Air
DOI: 10.3233/XST-1996-6101(Journal) (5559339-N)
==========================================================

Created: 2019-11-30 16:16:53
ConfID: 5559252
CauseID: 1459178433
JT: Journal of X-Ray Science and Technology
MD: Tatchyn,1,1,79,1989,Generation of Soft X-Ray/VUV Photons with a Hybrid/Bias Micropole Undulator on the LLNL Linac
DOI: 10.3233/XST-1989-1104(Journal) (5559252-N)
==========================================================

Created: 2019-11-30 16:16:59
ConfID: 5559253
CauseID: 1459178438
JT: Journal of X-Ray Science and Technology
MD: Gray,1,1,99,1989,Measured Response of Multilayers to Damaging Fluxes
DOI: 10.3233/XST-1989-1105(Journal) (5559253-N)
==========================================================

Created: 2019-11-30 16:17:08
ConfID: 5559254
CauseID: 1459178447
JT: Journal of X-Ray Science and Technology
MD: Bonse,1,1,107,1989,Scanning Interferometer for the Measurement of Anomalous Dispersion with Synchrotron X Rays
DOI: 10.3233/XST-1989-1106(Journal) (5559254-N)
==========================================================

Created: 2019-11-30 16:17:19
ConfID: 5559255
CauseID: 1459178457
JT: Journal of X-Ray Science and Technology
MD: Schwarzenberger,1,2,134,1989,Phase Measurement X-Ray Interferometry
DOI: 10.3233/XST-1989-1202(Journal) (5559255-N)
==========================================================

Created: 2019-11-30 16:16:33
ConfID: 5559249
CauseID: 1459178415
JT: Journal of X-Ray Science and Technology
MD: Knight,1,1,1,1989,EDITORIAL
DOI: 10.3233/XST-1989-1101(Journal) (5559249-N)
==========================================================

Created: 2019-11-30 16:16:38
ConfID: 5559250
CauseID: 1459178423
JT: Journal of X-Ray Science and Technology
MD: Baez,1,1,3,1989,The Early Days of X-Ray Optics—A Personal Memoir
DOI: 10.3233/XST-1989-1102(Journal) (5559250-N)
==========================================================

Created: 2019-11-30 16:16:44
ConfID: 5559251
CauseID: 1459178428
JT: Journal of X-Ray Science and Technology
MD: Ceglio,1,1,7,1989,Revolution in X-Ray Optics
DOI: 10.3233/XST-1989-1103(Journal) (5559251-N)
==========================================================

Created: 2019-11-30 16:17:54
ConfID: 5559260
CauseID: 1459178487
JT: Journal of X-Ray Science and Technology
MD: Shealy,1,2,190,1989,Design of a Normal Incidence Multilayer Imaging X-Ray Microscope
DOI: 10.3233/XST-1989-1207(Journal) (5559260-N)
==========================================================

Created: 2019-11-30 16:18:03
ConfID: 5559261
CauseID: 1459178493
JT: Journal of X-Ray Science and Technology
MD: Ford,1,2,207,1989,Improved Resolution of Soft X-Ray Contact Images Using Laser-Produced Plasmas
DOI: 10.3233/XST-1989-1208(Journal) (5559261-N)
==========================================================

Created: 2019-11-30 16:18:19
ConfID: 5559262
CauseID: 1459178506
JT: Journal of X-Ray Science and Technology
MD: Michette,2,1,1,1990,Laser-Generated Plasmas: Source Requirements for X-Ray Microscopy
DOI: 10.3233/XST-1990-2101(Journal) (5559262-N)
==========================================================

Created: 2019-11-30 16:18:23
ConfID: 5559263
CauseID: 1459178511
JT: Journal of X-Ray Science and Technology
MD: Henke,2,1,17,1990,Design and Characterization of X-Ray Multilayer Analyzers for the 50–1000 eV Region
DOI: 10.3233/XST-1990-2102(Journal) (5559263-N)
==========================================================

Created: 2019-11-30 16:17:28
ConfID: 5559256
CauseID: 1459178462
JT: Journal of X-Ray Science and Technology
MD: Allinson,1,2,143,1989,Charge Coupled Device (CCD) Area Detector for On-Line (40- to 80-ms) Acquisition of Laue Diffraction Data from Protein Crystals
DOI: 10.3233/XST-1989-1203(Journal) (5559256-N)
==========================================================

Created: 2019-11-30 16:17:34
ConfID: 5559257
CauseID: 1459178467
JT: Journal of X-Ray Science and Technology
MD: Tsacoyeanes,1,2,154,1989,Diamond vs Beryllium Films for Improving Survivability of Metal Mirrors against X Rays
DOI: 10.3233/XST-1989-1204(Journal) (5559257-N)
==========================================================

Created: 2019-11-30 16:17:44
ConfID: 5559258
CauseID: 1459178479
JT: Journal of X-Ray Science and Technology
MD: Goodman,1,2,162,1989,A Comparison of DEF X-Ray Film and a Photodiode Array (Reticon) as Detectors for an X-Ray Crystal Spectrometer
DOI: 10.3233/XST-1989-1205(Journal) (5559258-N)
==========================================================

Created: 2019-11-30 16:17:48
ConfID: 5559259
CauseID: 1459178481
JT: Journal of X-Ray Science and Technology
MD: Tjahjadi,1,2,171,1989,The Use of Color in Image Enhancement of X-Ray Microtomographs
DOI: 10.3233/XST-1989-1206(Journal) (5559259-N)
==========================================================

Created: 2019-11-30 16:21:09
ConfID: 5559284
CauseID: 1459178651
JT: Journal of X-Ray Science and Technology
MD: Voss,3,2,85,1992,A Scanning Soft X-Ray Microscope with an Ellipsoidal Focusing Mirror
DOI: 10.3233/XST-1992-3202(Journal) (5559284-N)
==========================================================

Created: 2019-11-30 16:21:19
ConfID: 5559285
CauseID: 1459178660
JT: Journal of X-Ray Science and Technology
MD: Boher,3,2,118,1992,Tungsten/Magnesium Silicide Multilayers for Soft X-Ray Optics
DOI: 10.3233/XST-1992-3204(Journal) (5559285-N)
==========================================================

Created: 2019-11-30 16:21:34
ConfID: 5559286
CauseID: 1459178670
JT: Journal of X-Ray Science and Technology
MD: Graeff,3,2,152,1992,Synchrotron Radiation White Beam Topography with an Oscillating Monochromator
DOI: 10.3233/XST-1992-3206(Journal) (5559286-N)
==========================================================

Created: 2019-11-30 16:21:39
ConfID: 5559287
CauseID: 1459178678
JT: Journal of X-Ray Science and Technology
MD: Kalata,3,3,157,1992,The Detective Quantum Efficiency of Television X-Ray Detectors
DOI: 10.3233/XST-1992-3301(Journal) (5559287-N)
==========================================================

Created: 2019-11-30 16:20:39
ConfID: 5559280
CauseID: 1459178625
JT: Journal of X-Ray Science and Technology
MD: Elsner,3,1,35,1991,Effective Area of the AXAF X-Ray Telescope: Dependence upon Dielectric Constants of Coating Materials
DOI: 10.3233/XST-1991-3104(Journal) (5559280-N)
==========================================================

Created: 2019-11-30 16:20:48
ConfID: 5559281
CauseID: 1459178631
JT: Journal of X-Ray Science and Technology
MD: Khan Malek,3,1,45,1991,A Review of Microfabrication Technologies: Application to X-Ray Optics
DOI: 10.3233/XST-1991-3105(Journal) (5559281-N)
==========================================================

Created: 2019-11-30 16:20:53
ConfID: 5559282
CauseID: 1459178636
JT: Journal of X-Ray Science and Technology
MD: Harvey,3,1,68,1991,Diffraction Effects in Grazing Incidence X-Ray Telescopes
DOI: 10.3233/XST-1991-3106(Journal) (5559282-N)
==========================================================

Created: 2019-11-30 16:20:59
ConfID: 5559283
CauseID: 1459178642
JT: Journal of X-Ray Science and Technology
MD: Speller,3,2,77,1992,Tissue Characterization Using Low Angle X-Ray Scattering
DOI: 10.3233/XST-1992-3201(Journal) (5559283-N)
==========================================================

Created: 2019-11-30 16:22:19
ConfID: 5559292
CauseID: 1459178711
JT: Journal of X-Ray Science and Technology
MD: Allred,3,3,222,1992,Raman Spectroscopic Analysis of Mo/Si Multilayers
DOI: 10.3233/XST-1992-3307(Journal) (5559292-N)
==========================================================

Created: 2019-11-30 16:22:33
ConfID: 5559293
CauseID: 1459178721
JT: Journal of X-Ray Science and Technology
MD: MacGowan,3,4,231,1992,Investigation of Damage to Multilayer Optics in X-Ray Laser Cavities: W/C, WRe/C, WC/C, Stainless-Steel/C, and Cr3C2/C Mirrors
DOI: 10.3233/XST-1992-3401(Journal) (5559293-N)
==========================================================

Created: 2019-11-30 16:22:44
ConfID: 5559294
CauseID: 1459178729
JT: Journal of X-Ray Science and Technology
MD: Gullikson,3,4,283,1992,A Soft X-Ray/EUV Reflectometer Based on a Laser Produced Plasma Source
DOI: 10.3233/XST-1992-3402(Journal) (5559294-N)
==========================================================

Created: 2019-11-30 16:22:48
ConfID: 5559295
CauseID: 1459178736
JT: Journal of X-Ray Science and Technology
MD: Zukowski,3,4,300,1992,Magnetic Form Factor of Nickel Determined by White Beam X-Ray Diffraction
DOI: 10.3233/XST-1992-3403(Journal) (5559295-N)
==========================================================

Created: 2019-11-30 16:21:53
ConfID: 5559288
CauseID: 1459178687
JT: Journal of X-Ray Science and Technology
MD: Dhez,3,3,176,1992,Multilayer X-Ray Mirror Calibration by an Energy Dispersive Method Using an X-Ray Tube and a Si(Li) Detector: Absolute Reflectivity, Energy Band Pass, and Overlapping Order Determination
DOI: 10.3233/XST-1992-3303(Journal) (5559288-N)
==========================================================

Created: 2019-11-30 16:21:59
ConfID: 5559289
CauseID: 1459178692
JT: Journal of X-Ray Science and Technology
MD: Ceglio,3,3,194,1992,Wafer Cost Analysis for a Soft X-Ray Projection Lithography System
DOI: 10.3233/XST-1992-3304(Journal) (5559289-N)
==========================================================

Created: 2019-11-30 16:22:08
ConfID: 5559290
CauseID: 1459178698
JT: Journal of X-Ray Science and Technology
MD: Filatova,3,3,204,1992,The Yoneda Effect in the Region of Ultrasoft X-Ray Radiation
DOI: 10.3233/XST-1992-3305(Journal) (5559290-N)
==========================================================

Created: 2019-11-30 16:22:14
ConfID: 5559291
CauseID: 1459178706
JT: Journal of X-Ray Science and Technology
MD: Aristov,3,3,211,1992,Dynamic X-Ray Diffraction by a Multilayer Mirror Modulated with a Transverse Acoustic Wave
DOI: 10.3233/XST-1992-3306(Journal) (5559291-N)
==========================================================

Created: 2019-11-30 16:19:03
ConfID: 5559268
CauseID: 1459178545
JT: Journal of X-Ray Science and Technology
MD: Karabekov,2,3,161,1990,Investigation of Crystal Perfection by Measuring the Collimating Slit Image Widening in Diffracted Synchrotron Radiation
DOI: 10.3233/XST-1990-2301(Journal) (5559268-N)
==========================================================

Created: 2019-11-30 16:19:09
ConfID: 5559269
CauseID: 1459178550
JT: Journal of X-Ray Science and Technology
MD: Partanen,2,3,165,1990,An Experimental and Theoretical Study of Pendellösung Fringes in Synchrotron Section Topographs of Silicon Wafers
DOI: 10.3233/XST-1990-2302(Journal) (5559269-N)
==========================================================

Created: 2019-11-30 16:19:19
ConfID: 5559270
CauseID: 1459178556
JT: Journal of X-Ray Science and Technology
MD: Stead,2,3,172,1990,Soft X-Ray Contact Microscopy of Biological Specimens: Aluminum-Coated Silicon Nitride Windows as XUV Filters
DOI: 10.3233/XST-1990-2303(Journal) (5559270-N)
==========================================================

Created: 2019-11-30 16:19:24
ConfID: 5559271
CauseID: 1459178564
JT: Journal of X-Ray Science and Technology
MD: Davis,2,3,180,1990,DuMond Diagram Mappings for Multi Asymmetric Crystal Monochromators
DOI: 10.3233/XST-1990-2304(Journal) (5559271-N)
==========================================================

Created: 2019-11-30 16:18:34
ConfID: 5559264
CauseID: 1459178519
JT: Journal of X-Ray Science and Technology
MD: Christensen,2,2,81,1990,Studies of Multilayers and Thin-Foil X-Ray Mirrors Using a Soft X-Ray Diffractometer
DOI: 10.3233/XST-1990-2201(Journal) (5559264-N)
==========================================================

Created: 2019-11-30 16:18:35
ConfID: 5559265
CauseID: 1459178520
JT: Journal of X-Ray Science and Technology
MD: Niu,2,2,95,1990,A New Three-Dimensional Reconstruction Method Using Algebraic Reconstruction Techniques
DOI: 10.3233/XST-1990-2202(Journal) (5559265-N)
==========================================================

Created: 2019-11-30 16:18:43
ConfID: 5559266
CauseID: 1459178525
JT: Journal of X-Ray Science and Technology
MD: Chapman,2,2,117,1990,Focusing and Collimation of X Rays Using Microchannel Plates: An Experimental Investigation
DOI: 10.3233/XST-1990-2203(Journal) (5559266-N)
==========================================================

Created: 2019-11-30 16:18:53
ConfID: 5559267
CauseID: 1459178532
JT: Journal of X-Ray Science and Technology
MD: Murakami,2,2,127,1990,Thermal X-Ray Emission from Ion-Beam-Heated Matter
DOI: 10.3233/XST-1990-2204(Journal) (5559267-N)
==========================================================

Created: 2019-11-30 16:20:00
ConfID: 5559276
CauseID: 1459178594
JT: Journal of X-Ray Science and Technology
MD: Eidmann,2,4,259,1990,Characterization of Pinhole Transmission Gratings
DOI: 10.3233/XST-1990-2403(Journal) (5559276-N)
==========================================================

Created: 2019-11-30 16:20:08
ConfID: 5559277
CauseID: 1459178597
JT: Journal of X-Ray Science and Technology
MD: Rarback,2,4,274,1990,Coherent Radiation for X-Ray Imaging—The Soft X-Ray Undulator and the X1A Beamline at the NSLS
DOI: 10.3233/XST-1990-2404(Journal) (5559277-N)
==========================================================

Created: 2019-11-30 16:20:28
ConfID: 5559278
CauseID: 1459178614
JT: Journal of X-Ray Science and Technology
MD: Nishimura,3,1,14,1991,Influence of Exposure Time on the Sensitivity of Kodak 101 X-Ray Film
DOI: 10.3233/XST-1991-3102(Journal) (5559278-N)
==========================================================

Created: 2019-11-30 16:20:33
ConfID: 5559279
CauseID: 1459178621
JT: Journal of X-Ray Science and Technology
MD: Puik,3,1,19,1991,Characterization of a Multilayer Coated Laminar Reflection Grating at λ = 0.154 nm
DOI: 10.3233/XST-1991-3103(Journal) (5559279-N)
==========================================================

Created: 2019-11-30 16:19:33
ConfID: 5559272
CauseID: 1459178570
JT: Journal of X-Ray Science and Technology
MD: Yao,2,3,195,1990,Synchrotron White Beam Topographic Imaging in Grazing Bragg-Laue Geometries
DOI: 10.3233/XST-1990-2305(Journal) (5559272-N)
==========================================================

Created: 2019-11-30 16:19:38
ConfID: 5559273
CauseID: 1459178576
JT: Journal of X-Ray Science and Technology
MD: Zegenhagen,2,3,214,1990,X-Ray Standing Wave Analysis of Highly Perfect Cu Crystals and Electrodeposited Submonolayers of Cd and Tl on Cu Surfaces
DOI: 10.3233/XST-1990-2306(Journal) (5559273-N)
==========================================================

Created: 2019-11-30 16:19:44
ConfID: 5559274
CauseID: 1459178580
JT: Journal of X-Ray Science and Technology
MD: Gaponov,2,4,241,1990,Normal-Incidence Multilayer Mirrors for the 120–450 Å Wavelength Region
DOI: 10.3233/XST-1990-2401(Journal) (5559274-N)
==========================================================

Created: 2019-11-30 16:19:53
ConfID: 5559275
CauseID: 1459178586
JT: Journal of X-Ray Science and Technology
MD: Elliott,2,4,249,1990,Application of X-Ray Microtomography in Materials Science Illustrated by a Study of a Continuous Fiber Metal Matrix Composite
DOI: 10.3233/XST-1990-2402(Journal) (5559275-N)